Introduction to Conventional Transmission Electron Microscopy
Published on 27. March 2003
Book
Paperback/Softback
742 pages
978-0-521-62995-9 (ISBN)
Description
This 2003 book covers the fundamentals of conventional transmission electron microscopy (CTEM) as applied to crystalline solids. Emphasis is on the experimental and computational methods used to quantify and analyze CTEM observations. A supplementary website containing interactive modules and free Fortran source code accompanies the text. The book starts with the basics of crystallography and quantum mechanics providing a sound mathematical footing for the rest of the text. The next section deals with the microscope itself, describing the various components in terms of the underlying theory. The second half of the book focuses on the dynamical theory of electron scattering in solids including its applications to perfect and defective crystals, electron diffraction and phase contrast techniques. Based on a lecture course given by the author in the Department of Materials Science and Engineering at Carnegie Mellon University, the book is ideal for graduate students as well as researchers new to the field.
Reviews / Votes
'... ideal for students as well as for researchers new to the field.' Materials World 'The inner workings of the TEM are described comprehensively, from both a theoretical and practical point of view ... engagingly written ... This book aims to be a practical introduction and guide to TEM and achieves this extremely well.' Materials World '... a clear and extremely well-illustrated do-it-yourself book on conventional TEM of crystals and their defects.' Ultramicroscopy 'The introduction to each chapter is engagingly written, generally beginning with some historic or real-world examples before getting into the mathematics behind the machine. This serves to whet the reader's appetite for more information as the chapters lead into well written mathematical theory ... The book aims to be a practical introduction and guide to TEM and achieves this extremely well. Any student who reads this book from cover to cover and follows the examples given will be well on their way to performing useful TEM evaluation.' Materials WorldMore details
Language
English
Place of publication
Cambridge
United Kingdom
Target group
Professional and scholarly
College/higher education
Product notice
Paperback (trade)
Illustrations
Worked examples or Exercises; 25 Tables, unspecified; 108 Halftones, unspecified; 214 Line drawings, unspecified
Dimensions
Height: 244 mm
Width: 170 mm
Thickness: 40 mm
Weight
1257 gr
ISBN-13
978-0-521-62995-9 (9780521629959)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
02/2005
1st Edition
Cambridge University Press
€106.99
Available for download
Book
03/2003
Cambridge University Press
€186.94
Article exhausted; check for reprint
Previous edition
Book
03/2003
Cambridge University Press
€186.94
Article exhausted; check for reprint
Person
Professor of Materials Science and Engineering at Carnegie Mellon University.
Content
1. Basic crystallography; 2. Basic quantum mechanics; 3. The transmission electron microscope; 4. Getting started; 5. Dynamical electron scattering in perfect crystals; 6. Two-beam theory in defect-free crystals; 7. Systematic row and zone axis orientations; 8. Defects in crystals; 9. Electron diffraction patterns; 10. Phase contrast microscopy; Appendices.