
Electron Diffraction Techniques: Volume 2
John M. Cowley(Editor)
Oxford University Press
Published on 13. May 1993
Book
Hardback
434 pages
978-0-19-855733-3 (ISBN)
Description
Volume 2 deals with those aspects when there is a stronger correlation of the diffraction phenomena with the electron microscope imaging.
Reviews / Votes
'These specialist books will find their way into the libraries of pracitioners, who will use them as a source of references as examples, and as a means on initiating students into the wealth of detail that can be obtained from electron diffraction.'Professor J.A. Venables, University of Sussex, Contemporary Physics, 1993, volume 34, number 3 will be of prime interest to electron microscopists ... Anyone whose ideas about the applications of diffraction contrast are based on the textbooks of twenty years ago will rapidly be able to update them from the many beautiful and novel micrographs with which Amelinckx and van Dyck profusely illustrate their text ... presented very effectively and with a wide variety of different examples drawn from the authors' unrivalled experience ... a masterly review ... Taken together this set of two volumes certainly conveys most of the recent advances in electron diffraction and imaging. * MSA Bulletin 24.2, May 1994 * For the investigator interested in inorganic materials, there is much to praise in this volume ... there are no doubts in this reviewer's mind that these two volumes represent a significant addition to any electron diffractionist's bookshelf, with extensive material available for study in considering new research directions. * Douglas L. Dorset, Acta Cryst. (1994) A50 *
More details
Series
Language
English
Place of publication
Oxford
United Kingdom
Target group
Professional and scholarly
Illustrations
numerous halftones, line drawings and tables
Dimensions
Height: 240 mm
Width: 160 mm
Thickness: 29 mm
Weight
816 gr
ISBN-13
978-0-19-855733-3 (9780198557333)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Editor
Professor, Department of PhysicsProfessor, Department of Physics, Arizona State University, Tempe, Arizona, USA
Content
S. Amelinckx & D. van Dyck: EM imaging and diffraction contrast; K. Yagi: Rheed and REM; J. Gjonnes: Disorder and defect scattering; S. Amelinckx & D. van Dyck: Electron diffraction effects due to modulated structures; M. Carr & C. Lyman: Identifications of unknowns; Index.