
Advances in X-Ray Analysis
Volume 27
Jerome B. Cohen(Author)
Kluwer Academic / Plenum Publishers
Will be published approx. on 1. June 1984
Book
Hardback
596 pages
978-0-306-41712-2 (ISBN)
Description
This volume constitutes the proceedings of the 1983 Denver Conference on Applications of X-ray Analysis and is the 27th in the series. The conference was held jointly with the American Crystal lographic Association at Snowmass Resort, Colorado, from August 1 to 5, 1983. The papers appearing in this volume are only from pre dominantly Denver Conference (DC) sessions and from joint DC/ACA sessions. The early plans for holding a joint conference were initiated some three years ago by Q. C. Johnson of Lawrence Livermore Lab, J. B. Cohen of Northwestern University and P. K. Predecki of the University of Denver and were eventually brought to fruition by a jOint organizing committee consisting of: O. P. Anderson, Colorado State University (ACA) , D. E. Leyden, Colorado State University (DC), R. D. Witters, Colorado School of Mines (ACA) and P. K. Predecki (DC). We take this opportunity to thank the committee members and the early planners for their vision, ingenuity and hard work without which the conference would not have materialized. There was no plenary session in 1983, instead a number of special sessions were organized and chaired by various individuals.
More details
Edition
1984 ed.
Language
English
Place of publication
New York
United States
Publishing group
Kluwer Academic Publishers Group
Target group
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
596 p.
Dimensions
Height: 0 mm
Width: 0 mm
Weight
1200 gr
ISBN-13
978-0-306-41712-2 (9780306417122)
DOI
10.1007/978-1-4613-2775-2
Schweitzer Classification
Other editions
Additional editions

Book
10/2011
Springer
€53.49
Shipment within 15-20 days
Content
I. J. D. Hanawalt Award Session On Search/Match Methods.- II. X-Ray Strain and Stress Determination.- III. Position Sensitive Detectors and X-Ray Instrumentation.- IV. Quantitative Phase Analysis by XRD.- V. Other XRD Applications.- VI. J. Gilfrich Honorary Session on Trends in XRF Instrumentation.- VII. Mathematical Models and Computer Applications in XRF.- VIII. Applications of XRF to Archeological, Geochemical and Industrial Materials.- IX. Other XRF Applications.- Author Index.