Advanced Mathematical And Computational Tools In Metrology V
Will be published approx. on 12. March 2001
Book
Hardback
392 pages
978-981-02-4494-1 (ISBN)
Description
Advances in metrology depend on improvements in scientific and technical knowledge and in instrumentation quality, as well as on better use of advanced mathematical tools and development of new ones. In this volume, scientists from both the mathematical and the metrological fields exchange their experiences. Industrial sectors, such as instrumentation and software, will benefit from this exchange, since metrology has a high impact on the overall quality of industrial products, and applied mathematics is becoming more and more important in industrial processes.This book is of interest to people in universities, research centers and industries who are involved in measurements and need advanced mathematical tools to solve their problems, and also to those developing such mathematical tools.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
College/higher education
Professional and scholarly
Product notice
sewn/stitched
Cloth over boards
Dimensions
Height: 223 mm
Width: 162 mm
Thickness: 25 mm
Weight
667 gr
ISBN-13
978-981-02-4494-1 (9789810244941)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Persons
Content
Discrete B-splines approximation in a variety of norms, I.J. Anderson and D.A. Turner; local and global calibration of coordinate measuring machines, S.D. Antunes et al; interactive bootstrap computing on the Internet, P. Ciarlini et al; use of Monte Carlo simulation for uncertainty evaluation in metrology, M.G. Cox et al; assessment of current methods of analysis for quantitative in-vivo magnetic resonance spectroscopy, C. Elster et al; the mutual recognition arrangement (MRA) - recognizing national traceability, E. Filipe; self-calibration and error separation in metrology, A.B. Forbes and I.M. Smith; mathematical model adequacy in metrology - step-by-step approach, V.A. Granovsky and T.N. Siraya; databases in metrology - requirements and solutions, V. Hartmann et al; tools for quality testing of batches of artifacts - the cryogenic thermometers for the LHC, D. Ichim et al; Bayesian approaches to data fusion in metrology, G.P. Kelly; estimators for key comparison reference values, R. Kohler; an algorithm for on-line outlier rejection by sequence analysis in data acquisition, F. Pavese et al. (Part contents).