
Characterization of Amorphous and Crystalline Rough Surface -- Principles and Applications: Volume 37
Academic Press
Published on 23. October 2000
Book
Hardback
417 pages
978-0-12-475984-8 (ISBN)
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Description
The structure of a growth or an etch front on a surface is not only a subject of great interest from the practical point of view but also is of fundamental scientific interest. Very often surfaces are created under non-equilibrium conditions such that the morphology is not always smooth. In addition to a detailed description of the characteristics of random rough surfaces, Experimental Methods in the Physical Sciences, Volume 37, Characterization of Amorphous and Crystalline Rough Surface-Principles and Applications will focus on the basic principles of real and diffraction techniques for quantitative characterization of the rough surfaces. The book thus includes the latest development on the characterization and measurements of a wide variety of rough surfaces. The complementary nature of the real space and diffraction techniques is fully displayed.
More details
Series
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
Experimental researchers, graduate students, and industrial practitioners in applied physics (especially in the areas of thin film growth, optical coating, plasma etching, patterning, machining, polishing, fracture, tribology, and related areas)
Dimensions
Height: 229 mm
Width: 152 mm
Weight
760 gr
ISBN-13
978-0-12-475984-8 (9780124759848)
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Schweitzer Classification
Persons
Yiping Zhao is Associate Professor of Physics in the Department of Physics and Astronomy, University