
Predictive Technology Model for Robust Nanoelectronic Design
Yu Cao(Author)
Springer (Publisher)
Published on 12. July 2011
Book
Hardback
XV, 173 pages
978-1-4614-0444-6 (ISBN)
Description
Predictive Technology Model for Robust Nanoelectronic Design explains many of the technical mysteries behind the Predictive Technology Model (PTM) that has been adopted worldwide in explorative design research. Through physical derivation and technology extrapolation, PTM is the de-factor device model used in electronic design. This work explains the systematic model development and provides a guide to robust design practice in the presence of variability and reliability issues. Having interacted with multiple leading semiconductor companies and university research teams, the author brings a state-of-the-art perspective on technology scaling to this work and shares insights gained in the practices of device modeling.
More details
Series
Edition
2011 ed.
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
18 s/w Tabellen, 128 Abbildungen
XV, 173 p.
Dimensions
Height: 246 mm
Width: 164 mm
Thickness: 18 mm
Weight
428 gr
ISBN-13
978-1-4614-0444-6 (9781461404446)
DOI
10.1007/978-1-4614-0445-3
Schweitzer Classification
Other editions
Additional editions

Book
08/2013
Springer
€106.99
Shipment within 15-20 days

E-Book
07/2011
1st Edition
Springer Science+Business Media
€96.29
Available for download
Content
1. Introduction.- 2. Predictive Technology Model of Conventional CMOS Devices.- 3. Predictive Technology Model of Enhanced CMOS Devices.- 4. Statistical Extraction and Modeling of CMOS Variability.- 5. Modeling of Temporal Reliability Degradation.- 6. Modeling of Interconnect Parasitics.- 7. Design Benchmark with Predictive Technology Model.- 8. Predictive Process Design Kits.- 9. Predictive Modeling of Carbon Nanotube Devices.- 10. Predictive Technology Model for Future Nanoelectronic Design.