Polarization-Sensitive Speckle Interferometer for Roughness Measurement

The goal of this work is to develop a novel interferometric method for roughness measurement. Contrary to conventional approaches, the depolarization of the scattered light by the rough sample is considered, leading to a more accurate estimation of the roughness in the sub-wavelength domain and at the same time non-destructive and fast measurements. Compared to earlier works, the more general theory allows the application to other optical devices where depolarization of light occurs.