C H N and O in SI and Characterization and Simulation of Materials and Processes
Proceedings of Symposium N and Symposium G of the 1995 E-Mrs Spring Conference, Held in Strasbourg, France, 22-26 May 1995
Elsevier (Publisher)
Published on 31. July 1996
Book
Hardback
570 pages
978-0-444-82413-4 (ISBN)
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Description
This collection of symposia papers is divided into two sections. The first presents a state-of-the-art review of the topic - carbon, hydrogen, nitrogen, and oxygen in silicon and in other elemental superconductors. The second section deals with two areas: advanced instrumentation allowing for direct access to atomic mechanisms; and technological development, which, particularly in the field of microelectronics and microsystems, requires as a result of the miniaturization race, a precise mastery of the microscopic mechanisms.
This collection of symposia papers is divided into two sections. The first presents a state-of-the-art review of the topic - carbon, hydrogen, nitrogen, and oxygen in silicon and in other elemental superconductors. The second section deals with two areas: advanced instrumentation allowing for direct access to atomic mechanisms; and technological development, which, particularly in the field of microelectronics and microsystems, requires as a result of the miniaturization race, a precise mastery of the microscopic mechanisms.
This collection of symposia papers is divided into two sections. The first presents a state-of-the-art review of the topic - carbon, hydrogen, nitrogen, and oxygen in silicon and in other elemental superconductors. The second section deals with two areas: advanced instrumentation allowing for direct access to atomic mechanisms; and technological development, which, particularly in the field of microelectronics and microsystems, requires as a result of the miniaturization race, a precise mastery of the microscopic mechanisms.
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Series
Language
English
Place of publication
Oxford
United Kingdom
Publishing group
Elsevier Science & Technology
Target group
Professional and scholarly
Illustrations
indexes
ISBN-13
978-0-444-82413-4 (9780444824134)
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Other editions
Additional editions

A. Borghesi | U. M. Gösele | J. Vanhellemont
C, H, N and O in Si and Characterization and Simulation of Materials and Processes
E-Book
12/2012
Elsevier
€190.00
Available for download
Persons
Editor
Universita degli Studi di Modena, Italy
Max-Planck Institute of Microstructure Physics, Haale/Saale, Germany