Protocol Test Systems V
Proceedings of the IFIP TC6/WG6.1 Fifth Working Conference, Montreal, Quebec, Canada, 28-30 September 1992
Published on 9. March 1993
Book
Paperback/Softback
344 pages
978-0-444-89980-4 (ISBN)
Description
Important issues in the area of protocol testing are examined in this volume, from consideration of recent developments, through a review of the current state of the art, to discussions of likely trends and directions for the future. The major topics covered include: theoretical foundations; conformance testing issues; test specification issues; test selection-LOTOS; test selection and optimization; multi-party testing experiences and test selection-non-determinism. Interoperability testing, test coverage and testablity, and GSM testing issues are also explored and the book contains three invited papers on broadband ISDN testing, conformance testing experience and on test selection based on abstract data type specification.
Important issues in the area of protocol testing are examined in this volume, from consideration of recent developments, through a review of the current state of the art, to discussions of likely trends and directions for the future. The major topics covered include: theoretical foundations; conformance testing issues; test specification issues; test selection-LOTOS; test selection and optimization; multi-party testing experiences and test selection-non-determinism. Interoperability testing, test coverage and testablity, and GSM testing issues are also explored and the book contains three invited papers on broadband ISDN testing, conformance testing experience and on test selection based on abstract data type specification.
Important issues in the area of protocol testing are examined in this volume, from consideration of recent developments, through a review of the current state of the art, to discussions of likely trends and directions for the future. The major topics covered include: theoretical foundations; conformance testing issues; test specification issues; test selection-LOTOS; test selection and optimization; multi-party testing experiences and test selection-non-determinism. Interoperability testing, test coverage and testablity, and GSM testing issues are also explored and the book contains three invited papers on broadband ISDN testing, conformance testing experience and on test selection based on abstract data type specification.
More details
Series
Language
English
Place of publication
Oxford
United Kingdom
Publishing group
Elsevier Science & Technology
Target group
College/higher education
Professional and scholarly
Illustrations
Illustrations
Dimensions
Height: 230 mm
ISBN-13
978-0-444-89980-4 (9780444899804)
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Schweitzer Classification
Persons
Content
Part 1 Invited papers: issues in testing fast packet services over the broadband ISDN, M. Koblentz; testing in practice - OSI Test Center, M. Haulard la Briere; test selection based on ADT specifications, M.-C. Gaudel. Part 2 Theoretical foundations: the limited power of testing, M. Phalippou; on asynchronous testing, L. Verhaard et al; characterizing and ordering errors detected by conformance testing, K. Drira et al. Part 3 Conformance testing issues: on inconclusive verdict in conformance testing, S.T. Chanson and Q. Li; automated test case selection based on test coverage metrics, M. McAllister et al; diagnostic tests for single transition faults in non-deterministic finite state machines, A. Ghedamsi et al. Part 4 Test specification issues: an approach to the test of an ATM-based signalling application, M. di Concetto et al; an operational semantics for concurrent TTCN, T. Walter and B. Plattner. Part 5 Panel discussion on interoperabability testing: the silence of the LANs, D.J. Dwyer; interoperability testing panel minutes, J.-P. Favreau; position statements. Part 6 Panel discussion on test coverage and testability: summary of panel presentations and discussion, R.L. Probert. Part 7 Test selection - LOTOS: specification and derivation of OSI conformance test suites, T. Robles et al; interactive test generation from LOTOS specifications, S.P. van de Burgt et al; test system for a restricted class of LOTOS expressions with data parameters, T. Higashino et al. Part 8 Test selection and optimization: applications of sufficient conditions for efficient protocol test generation, A. Chung and D. Sidhu; a further optimization technique for conformance testing based on multiple UIO sequences, Z. Lidong et al; automated protocol conformance test generation based on formal methods for LOTOS specifications, A.R. Cavalli et al. Part 9 Multi-party testing experience: the IS-IS multi-party conformance test system, D. Tang et al; ISO conformance testing of the GSM mobile network system, R. Koester and M. Dicks; non-deterministic and fault behaviour, M.F. Witteman et al. Part 10 Panel discussion on GSM testing issues: position statements, Part 11 Test selection - non-determinism: test derivation from non-deterministic finite state machines, H. Kloosterman; generation of adaptive test cases from non-deterministic finite state models, P. Tripathy and K. Naik. Part 12 Overview of tool demonstrations.