
Reliability Prediction from Burn-In Data Fit to Reliability Models
Joseph Bernstein(Author)
Academic Press
Published on 10. March 2014
Book
Paperback/Softback
108 pages
978-0-12-800747-1 (ISBN)
Description
This work will educate chip and system designers on a method for accurately predicting circuit and system reliability in order to estimate failures that will occur in the field as a function of operating conditions at the chip level. This book will combine the knowledge taught in many reliability publications and illustrate how to use the knowledge presented by the semiconductor manufacturing companies in combination with the HTOL end-of-life testing that is currently performed by the chip suppliers as part of their standard qualification procedure and make accurate reliability predictions. This book will allow chip designers to predict FIT and DPPM values as a function of operating conditions and chip temperature so that users ultimately will have control of reliability in their design so the reliability and performance will be considered concurrently with their design.
More details
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
Chip designers, electronic system designers and reliability engineers in electronics companies, chip manufacturers and microelectronics/ system designers
Product notice
Paperback (trade)
Dimensions
Height: 228 mm
Width: 151 mm
Thickness: 10 mm
Weight
172 gr
ISBN-13
978-0-12-800747-1 (9780128007471)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Person
Joseph B. Bernstein is Professor of Electrical Engineering at Ariel University, Ariel, Israel. He received his PhD from MIT, Cambridge, MA, USA, and has previously worked as a Professor at Bar Ilan University, Israel, and at the University of Maryland and the MIT Lincoln Laboratory. He has co-authored two books.
Content
Introduction1. Shortcut to accurate reliability prediction2. M-HTOL Principles3. Failure Mechanisms4. New M-HTOL Approach5. Bibliography