Particle Characterization in Technology
Volume II: Morphological Analysis
John Keith Beddow(Author)
CRC Press
Published on 14. August 1984
Book
Hardback
288 pages
978-0-8493-5785-5 (ISBN)
More details
Series
Language
English
Place of publication
Bosa Roca
United States
Publishing group
Taylor & Francis Inc
Target group
College/higher education
Professional and scholarly
Weight
907 gr
ISBN-13
978-0-8493-5785-5 (9780849357855)
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Schweitzer Classification