Frontiers Of Reliability
Will be published approx. on 3. August 1998
Book
Hardback
448 pages
978-981-02-3360-0 (ISBN)
Description
This volume presents recent results in reliability theory by leading experts in the world. It will prove valuable for researchers, and users of reliability theory. It consists of refereed invited papers on a broad spectrum of topics in reliability. The subjects covered include Bayesian reliability, Bayesian reliability modeling, confounding in a series system, DF tests, Edgeworth approximation to reliability, estimation under random censoring, fault tree reduction for reliability, inference about changes in hazard rates, information theory and reliability, mixture experiment, mixture of Weibull distributions, queuing network approach in reliability theory, reliability estimation, reliability modeling, repairable systems, residual life function, software spare allocation systems, stochastic comparisons, stress-strength models, system-based component test plans, and TTT-transform.
More details
Series
Language
English
Place of publication
Singapore
Singapore
Target group
Professional and scholarly
ISBN-13
978-981-02-3360-0 (9789810233600)
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Schweitzer Classification
Persons
Content
A Bayesian approach using nonhomogeneous poisson processes for software reliability models, J.A. Achcar et al; the class of life distributions that are Laplace order dominated by the exponential law and its ramifications, S.K. Basu and M. Mitra; on smoothed functional estimation under random censoring, Y.P. Chaubey and P.K. Sen; inference about sharp changes in hazard rates, J.K. Ghosh et al; stochastic comparisons of spacings and order statistics, S.C. Kochar; statistical approaches to modelling and estimating software reliability, T.K. Nayak; parameter estimation in software reliability growth models, L.D. Ries and A.P. Basu; role of stochastic orderings in spare allocation in systems, H. Singh; ordinary and Bayesian approach to life testing using the extreme value distribution, C.P. Tsokos; fault tree reduction for reliability analysis and improvement, M. Xie et al. (Part contents).