
Scientific Computing in Electrical Engineering
SCEE 2014, Wuppertal, Germany, July 2014
Springer (Publisher)
Published on 27. May 2018
Book
Paperback/Softback
XI, 256 pages
978-3-319-80800-0 (ISBN)
Description
This book is a collection of selected papers presented at the 10th
International Conference on Scientific Computing in Electrical Engineering
(SCEE), held in Wuppertal, Germany in 2014. The book is divided into five
parts, reflecting the main directions of SCEE 2014: 1. Device Modeling,
Electric Circuits and Simulation, 2. Computational Electromagnetics, 3. Coupled
Problems, 4. Model Order Reduction, and 5. Uncertainty
Quantification. Each part starts with a general introduction followed by
the actual papers.
The aim of the SCEE 2014 conference was to bring together scientists
from academia and industry, mathematicians, electrical engineers, computer
scientists, and physicists, with the goal of fostering intensive discussions on
industrially relevant mathematical problems, with an emphasis on the modeling
and numerical simulation of electronic circuits and devices, electromagnetic
fields, and coupled problems. The methodological focus was on model order
reduction anduncertainty quantification.
More details
Series
Edition
Softcover reprint of the original 1st ed. 2016
Language
English
Place of publication
Cham
Switzerland
Publishing group
Springer International Publishing
Target group
Professional and scholarly
Illustrations
67 farbige Abbildungen, 58 s/w Abbildungen
XI, 256 p. 125 illus., 67 illus. in color.
Dimensions
Height: 235 mm
Width: 155 mm
Thickness: 15 mm
Weight
411 gr
ISBN-13
978-3-319-80800-0 (9783319808000)
DOI
10.1007/978-3-319-30399-4
Schweitzer Classification
Other editions
Additional editions

Andreas Bartel | Markus Clemens | Michael Günther
Scientific Computing in Electrical Engineering
SCEE 2014, Wuppertal, Germany, July 2014
Book
05/2016
Springer
€160.49
Shipment within 10-15 days
Content
Part I Device Modelling, Electric Circuits and Simulation.- Part II Computational Electromagnetics.- Part III Coupled Problems.- Part IV Model Order Reduction.- Part V Uncertainty Quantification.