Advances in X-Ray Analysis
Published on 16. February 2013
Book
Paperback/Softback
XXI, 743 pages
978-1-4613-6667-6 (ISBN)
Description
The 39th Annual Denver X-Ray Conference on Applications of X-Ray Analysis was held July 30 -August 3, 1990, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. The "Denver Conference" is recognized to be a major event in the x-ray analysis field, bringing together scientists and engineers from around the world to discuss the state of the art in x-ray applications as well as indications for future develop ments. In recent years there has been a steady expansion of applications of x-ray analysis to characterize surfaces and thin films. To introduce the audience to one of the exciting and important new developments in x-ray fluorescence, the topic for the Plenary Session of the 1990 Conference was: "Surface and Near-Surface X-Ray Spectroscopy. " The Conference had the privilege of inviting five leading world experts in the field of x-ray spectroscopy to deliver lectures at the Plenary Session. The first two lectures were on total-reflection x-ray fluorescence spectrometry. Professor P. Wobrauschek of Austria reviewed "Recent Developments and Results in Total-Reflection X-Ray Fluorescence. " Trends and applications of the technique were also discussed. Dr. T. Arai of Japan reported on "Surface and Near-Surface Analysis of Silicon Wafers by Total Reflection X-Ray Fluorescence. " He emphasized the importance of using proper x-ray optics to achieve high signal-to-noise ratios. A mathematical model relating the x-ray intensity to the depth of x-ray penetration was also described.
More details
Edition
Softcover reprint of the original 1st ed. 1991
Language
English
Place of publication
New York
United States
Target group
Professional and scholarly
Research
Illustrations
224 s/w Abbildungen, 2 farbige Abbildungen
XXI, 743 p. 226 illus., 2 illus. in color.
Dimensions
Height: 254 mm
Width: 178 mm
Thickness: 41 mm
Weight
1417 gr
ISBN-13
978-1-4613-6667-6 (9781461366676)
DOI
10.1007/978-1-4615-3744-1
Schweitzer Classification
Other editions
Additional editions
C.S. Barrett | M. Amara | Ting C. Huang
Advances in X-Ray Analysis
Book
06/1991
Kluwer Academic / Plenum Publishers
€96.00
Article not available at the moment
Content
Recent Developments and Results in Total Reflection X-Ray Fluorescence Analysis.- Glancing Angle X-Ray Absorption Spectroscopy.- Semiconductor Surface Characterization by Synchrotron X-Ray Fluorescence Analysis.- Total-Reflection X-Ray Fluorescence of Thin Layers on and in Solids.- Trace Element Analysis of Solutions at the PPB Level.- Trace Analysis Using Eds: Applications to Thin-Film and Heterogeneous Samples.- Grazing Incidence X-Ray Fluorescence Analysis with Monochromatic Radiation.- Impurity Analysis on Si Wafer Using Monochro-Trex.- Chemical State Analysis by Soft X-Ray Emission Spectra with Molecular-Orbital Calculations.- Fundamentals of X-Ray Spectrometric Analysis Using Low-Energy Electron Excitation.- Chemical Bonding Studies of Solutions by High Resolution X-Ray Fluorescence Spectroscopy.- Advances in Boron Measurement with Wavelength Dispersive XRF.- Soft and Ultra-Soft X-Ray Spectrometry Using Long-Wavelength Dispersive Devices.- Requirement Analysis and Preliminary Design For Energy Dispersive X-Ray Fluorescence Analysis Software.- Quantitative XRF Analysis Using the Fundamental Algorithm.- Practical Application for the use of Statistics to Establish Quality Control and Implement Quality Assurance in X-Ray Fluorescence.- Drift in Energy Calibration of Energy Dispersive X-Ray Fluorescence Analyzers and Its Correction.- Current and Future Energy Dispersive Exafs Detector Systems.- High Throughput Rate Solid State Detector Systems for Fluorescence EXAFS.- A Review of the Relative Merits of Low Powered WDXRF EDXRF Spectrometers for Routine Quantitative Analysis.- Imaging XPS. A Contribution to 3D X-Ray Analysis.- Graphite Fusion of Geological Samples.- Fast, High-Resolution X-Ray Microfluorescence Imaging.- High-Temperature Displacement Measurement using AScanning Focussed X-Ray Line Source.- On-Belt Determination of Calcium Concentration by X-Ray Fluorescence.- Niobium Concentration Measurement in Steel Samples with TXRF.- Mass Absorption Coefficient Determination using Compton Scattered Tube Radiation: Applications, Limitations and Pitfalls.- Trace Element Analysis of Rocks by X-Ray Spectrometry.- X-Ray Fluorescence and Fire-Assay Collection: Useful Partners in the Determination of the Platinum-Group Elements.- X-Ray Fluorescence Analysis of High-Density Brines using a Compton Scattering Ratio Technique.- Secondary Target X-Ray Excitation in Vivo Measurement of Lead in Bone.- Phosphorus Determination in Borophosphosilicate or Phosphosilicate Glass Films on a Si Wafer by Wavelength Dispersive X-Ray Spectroscopy.- Non-Destructive Analysis of Venezuelan Artifacts of Different Sizes and Shapes for Provenance Studies.- X-Ray Fluorescence as a Problem-Solving Tool in the Paper Industry.- X-Ray Detectors: Pulse Height Shifts, Escape Peaks and Counting Losses.- Measurement of Mass Absorption Coefficients using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis.- Evaluation of the X-Ray Response of a Position-Sensitive Microstrip Detector with An Integrated Readout Chip.- Practical and "Unusual" Applications in X-Ray Diffraction using Position Sensitive Detectors.- CCD Based X-Ray Detectors.- Wide Angle and Small Angle X-Ray Scattering Applications using a Two-Dimensional Area Detector.- Evaluation of Reference X-Ray Diffraction Patterns in the Icdd Powder Diffraction File.- Matchdb-A Program for the Identification of Phases using a Digitized Diffraction-Pattern Database.- X-Ray Diffraction Analysis of Fly Ash. II. Results.- Development of a Calibration Method for Quantitative X-Ray Powder Diffraction ofSize-Segregated Aerosols.- Strategies for Preferred Orientation Corrections in X-Ray Powder Diffraction using Line Intensity Ratios.- Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry.- Mass Absorption Corrected X-Ray Diffraction Analysis of Entrained-Flow Reactor Coal Combustion Products.- A Focusing System for X-Ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell.- Phase Analysis of Metallic Plutonium-Containing Fuel Alloys using Neutron Diffraction.- High-Temperature XRD Analysis of Polymers.- Residual Strains in Al2O3/Sic (Whisker) Composite From 25-1000°C.- Applications of X-Ray Diffraction Crystallite Size/Strain Analysis to Seismosaurus Dinosaur Bone.- The Substructure of Austenite and Martensite Through a Carburized Surface.- Determination of Lattice Parameter and Strain of ? Phases in Nickel-Base Superalloys by Synchrotron Radiation Parallel Beam Diffractometry.- The Effect of Satellite Lines From the X-Ray Source on X-Ray Diffraction Peaks.- X-Ray Topography and Tem Study of Crystal Defect Propagation in Epitaxially Grown Algaas Layers on Gaas(001).- Lineshape Analysis of X-Ray Diffraction Profiles: Polyethylene and Model Copolymers.- Double-Crystal X-Ray Diffraction Studies of Si Ion-Implanted and Pulsed Laser-Annealed Gaas.- X-Ray Characterization of Thin Diamond Films Deposited by Hot-Filament Chemical Vapor Deposition.- Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films.- The Thickness Measurements of Thin Bulk Film by X-Ray Method.- Oxygen Concentration Determination in Silicon Single Crystals by Precision Lattice Parameter Measurement.- Thermal Stress Relaxation in Vapor Deposited Thin Films.- An Expert System for the Validation and Interpretation of X-Ray Residual Stress Data.-Residual Stresses in Railroad Car Wheels.- Measurement of Residual Stresses by X-Ray Diffraction Near Simulated Heat Affected Zones in Austenitic Stainless Steels.- Use of X-Ray Diffraction using Gaussian Curve Method for Measuring Plastic Strain of Steels.- X-Ray Elastic Constants For ?-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC (Whisker) Composite.- X-Ray Study on Fatigue Fracture Surfaces of Aluminum Alloy Reinforced with Silicon Carbide Whiskers.- Residual Stress Analysis of Silicon Nitride to Carbon Steel Joint.- Residual Stresses in Unidirectional Al2O3 Fiber/Silicate Glass Composites by X-Ray Diffraction.- X-Ray Residual Stress Measurement of Ground Surface of Metal-Ceramic Composite.- Determination of X-Ray Elastic Constants in a Ti-14Al-21Nb Alloy and a Ti-14Al-21Nb/Sic Metal Matrix Composite.- A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel.- Fracture Analysis of Nodular Cast Iron by X-Ray Fractography.- X-Ray Fractographic Study on Alumina and Zirconia Ceramics.- Author Index.