
Advances in X-Ray Analysis
Volume 32
Plenum Publishing Co.,N.Y.
Published on 1. June 1989
Book
Hardback
XXVI, 682 pages
978-0-306-43236-1 (ISBN)
Description
The 37th Annual Denver Conference on Applications of X-Ray Analysis was held August 1-5, 1988, at the Sheraton Steamboat Resort and Conference Center, Steamboat Springs, Colorado. As usual, alternating with x-ray diffraction, the emphasis this year was x-ray fluorescence, but as has been the pattern for several occasions over the last few years, the Plenary Session did not deal with that subject, specifically. In an attempt to introduce the audience to one of the new developments in x-ray analysis, the title of the session was "High Brilliance Sources/Applications," and dealt exclusively with synchrotron radiation, a topic which has made a very large impact on the x-ray community over the last decade. As the organizer and co-chairman of the Plenary Session (with Paul Predecki), it is my responsibility to report on that session here. The Conference had the privilege of obtaining the services of some of the preeminent practitioners of research using this remarkable x-ray source; they presented the audience with unusually lucid descriptions of the work which has been accomplished in the development and application of the continuous, high intensity, tunable, polarized and collimated x-rays available from no facility other than these specialized storage rings. The opening lecture (and I use that term intentionally) was an enthusiastic description of "What is Synchrotron Radiation?" by Professor Boris Batterman of Cornell University and the Cornell High Energy Synchrotron Sourc(! (CHESS).
More details
Edition
1989 ed.
Language
English
Place of publication
New York
United States
Publishing group
Springer Science+Business Media
Target group
College/higher education
Professional and scholarly
Research
Illustrations
XXVI, 682 p.
Dimensions
Height: 260 mm
Width: 183 mm
Thickness: 44 mm
Weight
1511 gr
ISBN-13
978-0-306-43236-1 (9780306432361)
DOI
10.1007/978-1-4757-9110-5
Schweitzer Classification
Other editions
Additional editions

Book
06/2013
Springer
€213.99
Shipment within 15-20 days
Content
I. High Brilliance Sources/Applications.- II. On-Line X-Ray Analysis.- III. Xrf Mathematical Models and Quantitation.- IV. Techniques And XRF Instrumentation.- V. XRF Applications.- VI. Analysis of Thin Films by XRD and XRF.- VII. X-Ray Stress Analysis.- VIII. Applications of Digitized XRD Patterns.- IX. Qualitative and Quantitative Phase Analysis Diffraction Applications.- X. X-Ray Tomography, Imaging, and Topography.- Author Index.