Advances in X-Ray Analysis
Volume 31
Will be published approx. on 1. June 1988
Book
Hardback
542 pages
978-0-306-42932-3 (ISBN)
Description
The continuing success of the Denver X-Ray Conference is, it seems to me, the consequence of three equally important facets of each meeting. These are: 1) the collegial atmosphere and workshops at which experts and novices mix, talk, and informally share information at many levels; 2) the plenary session at which information is presented that intentionally brings new ideas to attendees to broaden the scope of the field; and 3) the traditional sessions in which interesting reports on current research and applications are presented in a timely and professional way. The first and last of these are discussed separately by Paul Predecki and are organized (no small task!) by the entire advisory board. This requires much more than deciding whether yet another workshop on specimen preparation is needed and whom to prevail upon to organize and present it. In fact, few attendees at these workshops ever appreciate the level of effort that Paul and his staff expend to make sure everything comes off smoothly, even when hundreds of copies of handouts need to be whipped off at the last moment, travel problems arise, or unusual audio visual aids are suddenly needed. But my topic here is the second of the three facets listed above - the plenary session. Organizing this falls to a single individual, on the theory that one person can then approach enough others as speakers to put together a unified and yet diverse program of related and interesting review papers.
More details
Edition
1988 ed.
Language
English
Place of publication
New York
United States
Publishing group
Kluwer Academic Publishers Group
Target group
College/higher education
Professional and scholarly
Research
Product notice
sewn/stitched
Cloth over boards
Illustrations
542 p.
Dimensions
Height: 0 mm
Width: 0 mm
Weight
1130 gr
ISBN-13
978-0-306-42932-3 (9780306429323)
DOI
10.1007/978-1-4613-1035-8
Schweitzer Classification
Other editions
Additional editions
Book
10/2011
Springer
€53.49
Shipment within 15-20 days
Content
I. Microbeam Techniques and Imaging Methods for Materials Characterization.- Microdiffraction with Synchrotron Beams (or Ultra-High Pressure Research).- Microstructural and Chemical Analysis Using Electron Beams: The Analytical Electron Microscope.- X-Ray Imaging of Surface and Internal Structure.- X-Ray Imaging: Status and Trends.- Secondary Ion Mass Spectrometry and Related Techniques.- X-Ray Microscopy using Collimated and Focussed Synchrotron Radiation.- Imaging with Spectroscopic Data.- Small Area X-Ray Diffraction Techniques; Errors in Strain Measurement.- Elemental and Phase Mapping of Sputtered Binary Plutonium Alloys.- An Automated X-Ray Microfluorescence Materials Analysis System.- Industrial Applications of X-Ray Computed Tomography.- II. Characterization of Thin Films by XRD and XRF.- Correlations Between X-Ray Microstructures and Magnetic Properties of CoCrTa Alloy Thin Films.- Defect Structure of Synthetic Diamond and Related Phases.- Microstructural Characterization of Thin Polycrystalline Films by X-Ray Diffraction.- Automated X-Ray Topography and Rocking Curve Analysis: A reliability Study.- Grazing Incidence X-Ray Scattering Studies of Single Quantum Wells.- Dynamical Theory of Asymmetric X-Ray Diffraction for Strained Crystal Wafers.- Dynamical X-Ray Diffraction Simulations for Asymmetric Reflections for III-V Semiconductors Multilayers.- Simultaneous Determination of the Thickness and Composition of Thin Film Samples using Fundamental Parameters.- III. X-Ray Stress/Strain Determination, Fractography, Diffraction, Line Broadening Analysis.- The Phi-Integral Method for X-Ray Residual Stress Measurements.- Oscillations in Interplanar Spacing vs. Sin2?, A FEM Analysis.- Focusing Circle Errors in X-Ray Residual Stress Measurements of Nickel-BasedMaterials.- Residual Stress Analysis in Steels Having Preferred Orientation by Use of Synchrotron Radiation Source.- Macro and Micro-Stress Distributions in Filled Epoxy Systems.- Residual Stress Determination in Al2O3/SiC (Whisker) Composites by X-Ray Diffraction.- A Comparison of Diffraction Elastic Constants of Steel Measured with X-Rays and Neutrons.- Residual Stress in Two Dental Alloys During Porcelain Application.- Pre-Cracking Technique and Its Application to X-Ray Fractography of Alumina Ceramics.- X-Ray Fractography of Stress Corrosion Cracking in AISI 4340 Steel Under Controlled Electrode Potential.- A New Method for Evaluating X-Ray Diffraction Peak Broadening with Engineering Applications.- X-Ray Line Broadening Study on Shock-Modified Hematite.- IV. Quantitative and Qualitative XRD Phase Analysis.- Problems and Solutions in Quantitative Analysis of Complex Mixtures by X-Ray Powder Diffraction.- Preliminary Results from a Powder Diffraction Data Intensity Round-Robin.- The Estimation of Limits of Detection in RIM Quantitative X-Ray Diffraction Analysis.- Automated Quantitative Multiphase Analysis Using a Focusing Transmission Diffractometer in Conjunction with a Curved Position Sensitive Detector.- X-Ray Diffraction Analysis of Fly Ash.- Measuring Graphitic Carbon and Crystalline Minerals in Coals and Bottom Ashes.- V. X-Ray and Neutron Diffraction Applications Including Superconductors.- High Temperature Stability of Superconducting YBa2Cu3Ox as Characterized by X-ray Diffraction.- X-Ray Study of the BaO-Y2O3-CuOx System.- Comparison of Calculated and Experimental Powder X-Ray Diffraction Patterns of Organic Materials.- Neutron Diffraction - A Probe for Grain Size and Preferred Orientation in Zircaloy-Clad Uranium.- Applications of Pulsed Neutron PowderDiffraction to Actinide Elements.- VI. XRD Techniques, Instrumentation and P.C. Applications.- Asymmetric Crystals Re-Visited.- A 4 Crystal Monochromator for High Resolution Rocking Curves.- Laser Aligned Laue Technique for Small Crystals.- A Novel X-Ray Powder-Diffractometer, Measuring Preferred-Orientations.- Using Digitized X-Ray Powder Diffraction Scans as Input for a New PC-AT Search/Match Program.- PC Based Topography Technique.- VII. XRF Techniques, Instrumentation and Mathematical Models.- X-Ray Fluorescence Analysis of Alloy and Stainless Steels Using a Mercuric Iodide Detector.- X-Ray Fluorescence Spectrometry with Gas Proportional Scintillation Counters.- Advances and Enhancements in Light Element EDXRF.- Window Area Effects in the Detector Efficiency for Source Excited EDXRF Geometries.- A New Analysis Principle for EDXRF: The Monte-Carlo - Library Least-Squares Analysis Principle.- Defining and Deriving Theoretical Influence Coefficients in XRF Spectrometry.- VIII. Synchrotron Radiation and Other Applications of XRF.- Appearance Potential X-Ray Fluorescence Analysis.- Near-Surface Analysis of Semiconductor Using Grazing Incidence X-Ray Fluorescence.- A Scanning X-Ray Fluorescence Microprobe with Synchrotron Radiation.- Correction Method for Particle-Size Effect in XRF Analysis of Ore Slurries.- Intensity and Distribution of Background X-Rays in Wavelength Dispersive Spectrometry.- Author Index.