Advances in X-Ray Analysis: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis Held in Denver, August 22-24, 1973 Volume 17
Published on 1. April 1974
Book
Hardback
610 pages
978-0-306-38117-1 (ISBN)
Description
The successful application of x-r~ diffraction techniques and x-r~ spectrometry depends in large measure on the availability of dependable standards and reference data. The preparation of such standards in the fields of metallurgy, geology, life sciences, and other disciplines is both costly and time consuming. As a result. the necessary standards for effective utilization of existing instrumentation are often not available. One of the purposes of the invited papers in this 22nd Annual Denver X-Ray Conference was tc review the status of programs to prepare such standards and reference data. Simultaneously, it seemed appropriate to examine the role of sampling both in terms of standards and samples to be analyzed. The first section of the invited papers focuses on the standards and reference data problems. In addition, many of the contributed papers offer information on this theme. The second topic in the invited papers consi- ders the problem of sampling.
If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam- pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear- ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
If we recognize that analyses are conducted on samples which vary in size from several grams to a few micrograms or less, the magnitude of the random and systematic error components of sam- pling on the quality of results should be obvious. Many of the contributed papers in such fields as air pollution and similar disciplines speak clear- ly to the difficulty of obtaining "representative" samples. The papers contained in this volume and the many lively discussions such as the panel discussion at the close of the first session of papers should stimulate further attention to this vital topic.
More details
Language
English
Place of publication
United States
Publishing group
Springer Science+Business Media
Target group
Professional and scholarly
Illustrations
biography
Dimensions
Height: 250 mm
Width: 160 mm
ISBN-13
978-0-306-38117-1 (9780306381171)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
C. Grant
Advances in X-Ray Analysis
Volume 17: Proceedings of the Twenty-Second Annual Conference on Applications of X-Ray Analysis held in Denver, August 22-24, 1973
Book
05/2013
Springer
€53.49
Shipment within 7-9 days
Content
Standard Reference Materials and Meaningful X-Ray Measurements.- Standard Reference Materials - Their Production and Use.- Standard Data for the Identification of Phases by X-Ray Diffraction.- Provision, Suitability and Stability of Standards for Quantitative Powder Diffractometry.- Influence of Sampling on the Quality of Analyses with Emphasis on Powders.- Variation of Standards and Sampling Requirements for Complementary Analysis Methods.- Quantitative Analysis of Clay Minerals in Drilling Mud Solids.- Factors Limiting the Use of Standard Minerals in the X-Ray Diffraction Analysis of Clays.- Role of Diffractometer Geometry in the Standardization of Polycrystalline Data.- A New X-Ray Diffraction Method for Quantitative Multicomponent Analysis.- The A1 Fe Be4 Intermetallic Phase in Beryllium.- High Speed Retained Austenite Analysis with an Energy Dispersive X-Ray Diffraction Technique.- Quantitative X-Ray Diffraction Phase Analysis of the Oxidation of Steel by a Direct Comparison Method.- Low Energy X-Ray and Electron Absorption within Solids (100-1500 eV Region).- X-Ray Fluorescence Analysis of Portland Cement Through the Use of Experimentally Determined Correction Factors.- Specimen Standards for X-Ray Spectrometric Analysis of Atmospheric Aerosols.- A Versatile X-Ray Fluorescence Method for the Analysis of Sulfur in Geologic Materials.- Sampling and Standards in a Recycled World.- X-Ray Cross-Sections in Design and Analysis of Non-Dispersive Systems.- Use of Multiple Standards for Absorption Correction and Quantitation with Frieda.- Resin-Loaded Papers - A Versatile Medium for Sampling and Standardization.- Chelating Ion Exchange Resins and X-Ray Fluorescence.- Can Regression Equations be Optimized by Finagling X-Ray Intensities.- X-Ray Fluorescence Analysis of High-Temperature Super-alloys - Calibration and Standards.- Quantification of Sub-microgram Elemental Concentrations Using Micro-dot Samples.- A Rapid Direct X-Ray Fluorescence Method for Simultaneously Determining Brass Composition and Plating Weight for Brass-Plated-Steel Tire Cord Wires.- Quantitative Nondispersive X-Ray Fluorescence Analysis of Highly Radioactive Samples for Uranium and Plutonium Concentration.- The Effects of Self-Irradiation on the Lattice of 23B(80%)puO2 III.- The Effects of X-Ray Optics on Residual Stress Measurements in Steel.- X-Ray Diffraction Residual Stress Analysis Using High Precision Centroid Shift Measurement Techniques - Application to Uranium - 0.75 Weight Percent Titanium Alloy.- An X-Ray Amorphous Scattering Investigation of the Corrosion of a Pottassium Silicate Glass K20-3Si02.- A Review of X-Ray Diffraction Methods for Diffusion Studies.- Pole Figure Random Intensity Calculation Using Powder Integrated Ratios.- X-Ray Emission from Laser-Produced Plasmas.- Calculation and Measurement of Integral Reflection Coefficient Versus Wavelength of "Real" Crystals on an Absolute Basis.- X-Ray Production Cross Sections for Ti, Co, Ge, Rb and Sn by MeV Oxygen Ion Bombardment.- Some Biomedical Applications of Charged-Particle-Induced X-Ray Fluorescence Analysis.- Qualitative Analysis of the Kossel Back Reflection Pattern from Selected Semiconductors.- An Experimental Evaluation of the Atomic Number Effect.- X-Ray Emission from Thin Film Materials.- Auger Electron Emission Micrography and Microanalysis of Solid Surfaces.- A Combined Photoelectron/X-Ray Fluorescence Spectrometer.- A Spherically Bent Crystal X-Ray Spectrometer with Variable Curvature.- Measurement of the X-Ray Sensitivity of Silicon Diodes in the Energy Region 1.8 to 5-0 KeV.- Development of the High Performance "Solfa" On-Line Analyser to Measure Total Sulphur in Petroleum Distillates and Residual Fuels Using Non-Dispersive X-Ray Fluorescence.- Automatic Data Acquisition and Reduction for Elemental Analysis of Aerosol Samples.- A Secondary-Source, Energy-Dispersive X-Ray Spectrometer and its Application to Quantitative Analytical Chemistry.- Author Index.