Proceedings of the 11th European Symposium on the Reliability of Electron Devices, Failure Physics and Analysis
Published on 26. October 2000
Book
Paperback/Softback
550 pages
978-0-08-043913-6 (ISBN)
More details
Language
English
Place of publication
Amsterdam
Netherlands
Publishing group
Elsevier Science & Technology
Target group
College/higher education
Professional and scholarly
ISBN-13
978-0-08-043913-6 (9780080439136)
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Schweitzer Classification