Recombination Lifetime Measurements in Silicon
American Society for Testing & Materials (Publisher)
Published on 1. January 1998
Book
Hardback
415 pages
978-0-8031-2489-9 (ISBN)
More details
Language
English
Place of publication
West Consohocken
United States
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 230 mm
Weight
658 gr
ISBN-13
978-0-8031-2489-9 (9780803124899)
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Schweitzer Classification