Electron Microscopy and Multiscale Modeling
Proceedings of The EMMM-2007 International Conference
1st Edition
Published on 29. April 2008
Book
Hardback
VIII, 300 pages
978-0-7354-0519-6 (ISBN)
Description
The EMMM-2007 Conference brought together leading experts in electron microscopy and materials modeling from around the world to explore how to synergistically combine atomic scale characterization and modeling to enhance the development of new materials.