X-Rays and Extreme Ultraviolet Radiation
Principles and Applications
2nd Edition
Published on 16. February 2017
Book
Hardback
652 pages
978-1-107-06289-4 (ISBN)
Description
With this fully updated second edition, readers will gain a detailed understanding of the physics and applications of modern X-ray and EUV radiation sources. Taking into account the most recent improvements in capabilities, coverage is expanded to include new chapters on free electron lasers (FELs), laser high harmonic generation (HHG), X-ray and EUV optics, and nanoscale imaging; a completely revised chapter on spatial and temporal coherence; and extensive discussion of the generation and applications of femtosecond and attosecond techniques. Readers will be guided step by step through the mathematics of each topic, with over 300 figures, 50 reference tables and 600 equations enabling easy understanding of key concepts. Homework problems, a solutions manual for instructors, and links to YouTube lectures accompany the book online. This is the 'go-to' guide for graduate students, researchers and industry practitioners interested in X-ray and EUV interaction with matter.
Reviews / Votes
'A very clear, comprehensive and updated presentation of the basic physical properties and applications of XUV and X-ray radiation. I highly recommend the book for graduate students and anyone working in this fast growing field of research.' Claudio Pellegrini, University of California, Los Angeles, SLAC '... an exhaustive introduction ... a 'must have' on the shelf of every student in experimental condensed matter physics and, more in general, of any scientist committed to synchrotron and free electron laser radiation experiments.' Erik Vesselli, Nuclear Instruments and Methods in Physics ResearchMore details
Edition
2nd Revised edition
Language
English
Place of publication
Cambridge
United Kingdom
Target group
Professional and scholarly
Edition type
Revised edition
Illustrations
8 Tables, black and white; 91 Halftones, color; 187 Line drawings, color
Dimensions
Height: 250 mm
Width: 175 mm
Thickness: 39 mm
Weight
1293 gr
ISBN-13
978-1-107-06289-4 (9781107062894)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
E-Book
02/2017
Cambridge University Press
€57.99
Available for download
E-Book
12/2016
2nd Edition
Cambridge University Press
€67.99
Available for download
Persons
David Attwood is Professor Emeritus at the University of California, Berkeley. He is a co-founder of the Applied Science and Technology PhD program at Berkeley, and a Fellow of the American Physical Society and the Optical Society of America. He has published over 100 scientific papers and co-edited several books. Anne Sakdinawat is a scientist at the SLAC National Accelerator Laboratory, where she leads a scientifically motivated imaging and nanofabrication group co-located at Stanford University. She is the recipient of the international Meyer-Ilse Award for advances in X-ray microscopy, and a US Department of Energy Early Career Award.
Content
1. Introduction; 2. Radiation and scattering at EUV and X-ray wavelengths; 3. Wave propagation and refractive index at X-ray and EUV wavelengths; 4. Coherence at short wavelengths; 5. Synchrotron radiation; 6. X-ray and EUV free electron lasers; 7. Laser high harmonic generation; 8. Physics of hot dense plasmas; 9. Extreme ultraviolet and soft X-ray lasers; 10. X-ray and extreme ultraviolet optics; 11. X-ray and EUV imaging.