Test Generation for Very Large Scale Integration Chips
Published on 1. January 1988
Book
Hardback
400 pages
978-0-8186-8786-0 (ISBN)
More details
Language
English
Place of publication
Los Alamitos, CA
United States
Target group
College/higher education
Professional and scholarly
Dimensions
Height: 290 mm
Width: 220 mm
Thickness: 25 mm
Weight
1315 gr
ISBN-13
978-0-8186-8786-0 (9780818687860)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification