Advances in Imaging and Electron Physics: Volume 237
Academic Press
Published on 1. April 2026
Book
Hardback
258 pages
978-0-443-47108-7 (ISBN)
Description
Advances in Imaging and Electron Physics, Volume 237 merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. Chapters in this new release include Stochastic geometry with applications in materials science, Morphological models of random media, Grain models and application to microstructure simulation, MCMC algorithms for model parameterization, Tessellations models, Tesselation models, Fast simulation of tessellation models using Eikonal equation, Applications to Image Processing, Synthesis of Training Images for Supervised Learning Problems, and Segmentation Methods Based on the Eikonal Equation.
More details
Series
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
College/higher education
Dimensions
Height: 229 mm
Width: 152 mm
Weight
450 gr
ISBN-13
978-0-443-47108-7 (9780443471087)
Copyright in bibliographic data is held by Nielsen Book Services Limited or its licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Person
Dr Martin Hytch, serial editor for the book series "Advances in Imaging and Electron Physics (AIEP)?, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on "Quantitative high-resolution transmission electron microscopy (HRTEM)?, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Series Editor
Content
Stochastic geometry with applications in materials science
Morphological models of random media
Grain models and application to microstructure simulation
MCMC algorithms for model parameterization
Tessellations models
Tesselation models
Fast simulation of tessellation models using Eikonal equation
Applications to Image Processing
Synthesis of Training Images for Supervised Learning Problems
Segmentation Methods Based on the Eikonal Equation
Morphological models of random media
Grain models and application to microstructure simulation
MCMC algorithms for model parameterization
Tessellations models
Tesselation models
Fast simulation of tessellation models using Eikonal equation
Applications to Image Processing
Synthesis of Training Images for Supervised Learning Problems
Segmentation Methods Based on the Eikonal Equation