
Advances in Imaging and Electron Physics: Volume 191
Academic Press
Published on 26. August 2015
Book
Hardback
342 pages
978-0-12-802253-5 (ISBN)
Description
Advances in Imaging & Electron Physics merges two long-running serials-Advances in Electronics & Electron Physics and Advances in Optical & Electron Microscopy.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
More details
Series
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
Product notice
Laminated cover
Dimensions
Height: 229 mm
Width: 152 mm
Thickness: 24 mm
Weight
690 gr
ISBN-13
978-0-12-802253-5 (9780128022535)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions

Person
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Series Editor
Content
Femtosecond Electron Imaging and SpectroscopyMartin Berz, Philip M. Duxbury, Kyoko Makino and Chong-Yu Ruan
Imaging with Electrons, X-rays and Microwaves: Some Scattered ThoughtsRonald E. Burge
Imaging with Electrons, X-rays and Microwaves: Some Scattered ThoughtsRonald E. Burge