Advances in Imaging and Electron Physics: Volume 101
Academic Press
Published on 3. October 1997
Book
Hardback
244 pages
978-0-12-014743-4 (ISBN)
Description
Advances in Imaging & Electron Physics merges two long-running serials--Advances in Electronics and Electron Physics and Advances in Optical & Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.
Reviews / Votes
"Editing by P.W. Hawkes is immaculate and the production, in the usual style of Advances in Electronics & Electron Physics, results in a volume that will be a handsome addition to any bookshelf."--MRS BULLETIN"With the accelerating pace of research and development in so many areas of microscopy, keeping abreast of the widespread literature is becoming increasingly time-consuming. In Advances in Optical & Electron Microscopy the Editors are to be congratulated on bringing together in a convenient and comprehensible form a variety of topics of current interest."--J.A. Chapman in LABORATORY PRACTICEMore details
Language
English
Place of publication
San Diego
United States
Publishing group
Elsevier Science Publishing Co Inc
Target group
Professional and scholarly
Researchers in electrical engineering, optical science and technology, materials science, image processing, and mechanical engineering.
Dimensions
Height: 229 mm
Width: 152 mm
Weight
530 gr
ISBN-13
978-0-12-014743-4 (9780120147434)
Copyright in bibliographic data and cover images is held by Nielsen Book Services Limited or by the publishers or by their respective licensors: all rights reserved.
Schweitzer Classification
Other editions
Additional editions
Persons
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 - 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.
Series Editor
Aston University, Department of Electronic Engineering and Applied Physics, U.K.
Xerox Corporation, Palo Alto, California, U.S.A.
Editor-in-chief
Founder-President of the European Microscopy Society and Fellow, Microscopy and Optical Societies of America; member of the editorial boards of several microscopy journals and Serial Editor, Advances in Electron Optics, France
Content
P.E. Champness, Applications of Transmission Electron Microscopy in Mineralogy. K. Hiraga, High-Resolution Electron Microscopy of Quasicrystals. A. Imiya, Formal Polynomials for Image Processing. M. Molski, The Dual de Broglie Wave. Subject Index.