Particles on Surfaces

Detection: Adhesion, and Removal
 
 
CRC Press
  • 1. Auflage
  • |
  • erschienen am 25. August 2020
  • |
  • 440 Seiten
 
E-Book | PDF ohne DRM | Systemvoraussetzungen
978-1-000-10526-1 (ISBN)
 
This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.
1. Auflage
  • Englisch
  • Boca Raton
  • |
  • USA
Taylor & Francis Ltd
  • Für Beruf und Forschung
  • |
  • Für höhere Schule und Studium
  • 138,40 MB
978-1-000-10526-1 (9781000105261)
weitere Ausgaben werden ermittelt
K.L.Mittal
Particles on surfaces - adhesion induced deformations; surface force tensile interactions between micrometer size particles and a polyester-PDMS block copolymer substrate; polymer to particle adhesion probed with atomic force microscopy; surface particle contamination identification in microelectronics; an overview of spacecraft particulate contamination phenomena; contamination on optical surfaces-concerns, prevention, detection, and removal; an advanced surface particle and molecular contaminant identification, removal, and collection system; the role of air ionization in reducing surface contamination by particles in the cleanroom; selecting a contamination-free deburring process - testing abrasive blasting media; particle generation and control in tubing and piping connection design; detection and identification of particles on silicon surfaces; the characterization of particles on spacecraft returned from orbit; a light-scattering method for determining the composition of particles on surfaces; light scattering by spherical particles on planar multi-layered substrates; new test procedure for the examination of the particulate cleanliness of technical surfaces; discrimination between particulate and film type contamination on surfaces by means of total reflection X-ray fluorescence spectrometry; particle characterization on surfaces by Auger electron spectroscopy; interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves; removal of glass particles from glass surfaces - a review; particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement; fluid dynamics of liquid jets used for particle removal from surfaces; enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions; laser cleaning techniques for the removal of small surface particulates.

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