Conductive Atomic Force Microscopy

Applications in Nanomaterials
 
 
Wiley-VCH (Verlag)
  • erschienen am 3. August 2017
  • |
  • XX, 362 Seiten
 
E-Book | ePUB mit Adobe-DRM | Systemvoraussetzungen
978-3-527-69979-7 (ISBN)
 
The first book to summarize the applications of CAFM as the most important method in the study of electronic properties of materials and devices at the nanoscale.
To provide a global perspective, the chapters are written by leading researchers and application scientists from all over the world and cover novel strategies, configurations and setups where new information will be obtained with the help of CAFM.
With its substantial content and logical structure, this is a valuable reference for researchers working with CAFM or planning to use it in their own fields of research.
1. Auflage
  • Englisch
  • Newark
  • |
  • Deutschland
  • 14
  • |
  • 158 farbige Abbildungen, 54 s/w Abbildungen, 14 s/w Tabellen
  • 26,63 MB
978-3-527-69979-7 (9783527699797)
weitere Ausgaben werden ermittelt
Dr. Mario Lanza is a Young 1000 Talent Professor and group leader at the Institute of Functional Nano & Soft Materials, in Soochow University, China. He obtained his PhD in 2010 at the Electronic Engineering Department of Universitat Autonoma de Barcelona. In 2010 and 2011 he was postdoctoral scholar at Peking University in China, where he used the technique of conductive atomic force microscopy to characterize a wide range of two dimensional materials and nanowires. In 2012 and 2013 he was Marie Curie postdoctoral fellow at Stanford University, USA, where he used CAFM to study local defects in photoelectrodes for water-splitting solar cells.
Dr. Lanza has published more than 60 publications, most of them using the CAFM to study the nanoelectronic properties of different materials and devices. Furthermore, he developed different setups to enhance the capabilities of the CAFM, including an environmental chamber and ultra durable graphene-coated probe tips. Currently his research group is focused on the nanoscale electrical characterization of different devices, including field effect transistors, non-volatile memories and solar cells.
Foreword
Preface
Introduction to CAFM: History, Experimental and Current Status
Reliability of Polycrystalline Thin Oxides and Insulators
Investigation of High-k Dielectric Stacks by TUNA and CAFM: Advantages, Limitations and Applications
3D Tomography for Analyzing Conductive Filaments for Resistive Random Access Memory Devices
CAFM Applications for Energy Efficient and High-Frequency Electronics
Local Anodic Oxidation with AFM Tips
CAFM Studies of Low-Dimensional Materials
Design of a Logarithmic Amplifier for CAFM
Resiscopes for Analyzing Wide Dynamic Current Ranges
Combination of CAFM with the Probestation for Characterization of Resistive Switching and Channel Hot Carriers Degradation in FETs
Multiprobe CAFM
Scanning Capacitance Microscopy as a Complementary Tool for CAFM
KPFM and its Use to Characterize the CPD in Different Materials
Hot-Electron Nanoscopy Using Adiabatic Compression of Surface Plasmons
Fabrication and Reliability of AFM Nanoprobes

List of Contributors


 

Fei Hui

Soochow University

Collaborative Innovation Center of Suzhou Nanoscience and Technology

Institute of Functional Nano & SoftMaterials (FUNSOM)

199 Ren-Ai Road

Suzhou 215123

China

 

Marco Allione

King Abdullah University of Science and Technology (KAUST)

Physical Science and Engineering Division (PSE)

SMILEs Lab

Thuwal 23955-6900

Saudi Arabia

 

Lidia Aguilera

Technology Transfer Company

Knowledge Innovation Market

08005 Barcelona

Spain

 

Guenther Benstetter

Deggendorf Institute of Technology

Faculty of Electrical Media and Computer Engineering

94469 Deggendorf

Germany

 

Patrizio Candeloro

University Magna Graecia

Departement of Experimental Clinics

Bionem Lab Campus "Salvatore Venuta" Viale Europa

88100 Germaneto-Catanzaro

Italy

 

Umberto Celano

KU Leuven

Department of Physics and Astronomy (IKS)

Celestijnenlaan 200D

3001 Leuven

Belgium

  1. and

IMEC

Kapeldreef 75

3001 Heverlee (Leuven)

Belgium

 

Enzo Di Fabrizio

King Abdullah University of Science and Technology (KAUST)

Physical Science and Engineering Division (PSE)

SMILEs Lab

Thuwal 23955-6900

Saudi Arabia

  1. and

University Magna Graecia

Departement of Experimental Clinics

Bionem Lab Campus "Salvatore Venuta" Viale Europa

88100 Germaneto-Catanzaro

Italy

 

Rimma Dekhter

Nanonics Imaging Ltd

Jerusalem

Israel

 

Patrick Fiorenza

Consiglio Nazionale delle Ricerche Istituto per la Microelettronica e Microsistemi (CNR-IMM)

Strada VIII, 5

95121 Catania

Italy

 

Gabriele Fisichella

Consiglio Nazionale delle Ricerche Istituto per la Microelettronica e Microsistemi (CNR-IMM)

Strada VIII, 5

95121 Catania

Italy

 

Werner Frammelsberger

Deggendorf Institute of Technology

Faculty of Mechanical Engineering and Mechatronics

Dieter-Görlitz-Platz 1

94469 Deggendorf

Germany

 

Filippo Giannazzo

Consiglio Nazionale delle Ricerche Istituto per la Microelettronica e Microsistemi (CNR-IMM)

Strada VIII, 5

95121 Catania

Italy

 

Andrea Giugni

King Abdullah University of Science and Technology (KAUST)

Physical Science and Engineering Division (PSE)

SMILEs Lab

Thuwal 23955-6900

Saudi Arabia

 

Giuseppe Greco

Consiglio Nazionale delle Ricerche Istituto per la Microelettronica e Microsistemi (CNR-IMM)

Strada VIII, 5

95121 Catania

Italy

 

Joan Grifoll-Soriano

Technology Transfer Company

Knowledge Innovation Market

08005 Barcelona

Spain

 

Enric Grustan-Gutierrez

Soochow University

Collaborative Innovation Center of Suzhou Nanoscience and Technology Institute of Functional Nano & Soft Materials (FUNSOM)

199 Ren-Ai Road

Suzhou 215123

China

 

Alexander Hofer

Deggendorf Institute of Technology

Faculty of Electrical Media and Computer Engineering

94469 Deggendorf

Germany

 

Vanessa Iglesias

International Iberian Nanotechnology Laboratory

Av. Mestre José Veiga

4715-330 Braga

Portugal

 

Andrey Ignatov

Nanonics Imaging Ltd

Jerusalem

Israel

 

Xu Jing

Soochow University

Collaborative Innovation Center of Suzhou Nanoscience and Technology Institute of Functional Nano & Soft Materials (FUNSOM)

Suzhou 215123

China

 

Oliver Krause

Nanoworld Services GmbH

Schottkystraße 10

91058 Erlangen

Germany

 

Sasha Krol

Nanonics Imaging Ltd

Jerusalem

Israel

 

Mario Lanza

Soochow University

Institute of Functional Nano & Soft Materials

Suzhou 215123

China

 

David Lewis

Nanonics Imaging Ltd.

Har Hotzvim Hi-Tech Park

Beit Bynet

Jerusalem 97775

Israel

 

Donping Liu

Dalian Nationalities University

School of Physics and Materials Engineering

Dalian, Development Zone

Dalian 116600

China

 

Matteo Lorenzoni

Campus de la Universitat Autònoma de Barcelona

Microelectronics Institute of Barcelona (IMB-CNM, CSIC)

NEMS & Nanofabrication group

E-08193 Bellaterra

Spain

 

Yi Lv

Fudan University

Department of Physics

Shanghai 200433

China

 

Nicolas F. Martinez

Concept Scientifique Instruments (CSI)

17 Avenue des Andes

Les Ulis 91940

France

 

Sean Joseph O'Shea

A*STAR, Institute of Materials Research and Engineering (IMRE)

Materials Processing and Characterization Department

2 Fusionopolis Way

Singapore 138634

Singapore

 

Louis Pacheco

Concept Scientifique Instruments (CSI)

17 Avenue des Andes

Les Ulis 91940

France

 

Chengbin Pan

Soochow University

Collaborative Innovation Center of Suzhou Nanoscience and Technology Institute of Functional Nano & Soft Materials (FUNSOM)

199 Ren-Ai Road

Suzhou 215123

China

 

Mathias Rommel

Fraunhofer Institute for Integrated Systems and Device Technology IISB

Schottkystrasse 10

91058 Erlangen

Germany

 

Francesc Pérez-Murano

Campus de la Universitat Autònoma de Barcelona

Microelectronics Institute of Barcelona (IMB-CNM, CSIC)

NEMS & Nanofabrication group

E-08193 Bellaterra

Spain

 

Gerardo Perozziello

University Magna Graecia

Departement of Experimental Clinics

Bionem Lab Campus "Salvatore Venuta" Viale Europa

88100 Germaneto-Catanzaro

Italy

 

Kin Leong Pey

Singapore University of Technology and Design (SUTD)

Engineering Product Development (EPD)

Singapore 487372

Singapore

 

Fabrizio Roccaforte

Consiglio Nazionale delle Ricerche Istituto per la Microelettronica e Microsistemi (CNR-IMM)

Strada VIII, 5

95121 Catania

Italy

 

Albena Paskaleva

Institute of Solid State Physics Bulgarian Academy of Sciences

72 Tzarigradsko Chaussee

1784 Sofia

Bulgaria

 

Yuanyuan Shi

Soochow University

Collaborative Innovation Center of Suzhou Nanoscience and Technology Institute of Functional Nano & Soft Materials (FUNSOM)

199 Ren-Ai Road

Suzhou 215123

China

 

Shubhakar Kalya

Singapore University of Technology and Design (SUTD)

Engineering Product Development (EPD)

Singapore 487372

Singapore

 

Bo Song

Soochow University

Suzhou Key Laboratory of Macromolecular Design and Precision Synthesis

Jiangsu Key Laboratory of Advanced Functional Polymer Design and Application

College of Chemistry

Chemical Engineering and Materials Science

Suzhou 215123

China

 

Alina Strinkovsky

Nanonics Imaging Ltd

Jerusalem

Israel

 

Bruno Torre

King Abdullah University of Science and Technology (KAUST)

Physical Science and Engineering Division (PSE)

SMILEs Lab

Thuwal 23955-6900

Saudi Arabia

 

Wilfried Vandervorst

KU Leuven

Department of Physics and Astronomy (IKS)

Celestijnenlaan 200D

3001 Leuven

Belgium

  1. and

IMEC

Kapeldreef 75

3001 Heverlee (Leuven)

Belgium

 

Rong Wu

Fudan University

Department of Physics

Shanghai 200433

China

 

Yijun Xia

Soochow University

Suzhou Key Laboratory of Macromolecular Design and Precision Synthesis

Jiangsu Key Laboratory of Advanced Functional Polymer Design and Application

College of Chemistry

Chemical Engineering and Materials Science

Suzhou 215123

China

 

Fei Xue

Fudan University

Department of Physics

Shanghai...

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