This second volume of a series dedicated to the reliability of high-power mechatronic systems focuses specifically on issues, testing and analysis in automotive and aerospace applications. In the search to improve industrial competitiveness, the development of methods and tools for the design of products is especially pertinent in the context of cost reduction. This book proposes new methods that simultaneously allow for a quicker design of future mechatronic devices in the automotive and aerospace industries while guaranteeing their increased reliability. The reliability of these critical elements is further validated digitally through new multi-physical and probabilistic models that could ultimately lead to new design standards and reliable forecasting.
- Presents a methodological guide that demonstrates the reliability of fractured mechatronic components and devices
- Includes numerical and statistical models to optimize the reliability of the product architecture
- Develops a methodology to characterize critical elements at the earliest stage in their development
1. Accelerated Life Testing, Laurent Denis, Henri Grzeskowiak Daniel Trias and David Delaux 2. Highly Accelerated Testing Henri Grzeskowiak, Tony Lhommeau and David Delaux 3. Reliability Study for Cuboid Aluminum Capacitors with Liquid Electrolyte Chadia Lachkar, Moncef Kadi, Jean-Paterne Kouadio, Jean-François Goupy, Philippe Eudeline, Sébastien Boileau and Tarik Ait-Younes 4. The Reliability of Components: A New Generation of Film Capacitors Henri Grzeskowiak, Daniel Trias and David Delaux 5. Reliability and Qualification Tests for High-Power MOSFET Transistors Niemat Moultif, Mohamed Masmoudi, Eric Joubert and Olivier Latry 6. Fault Diagnosis in a DC/DC Converter for Electric Vehicles Houcine Chafouk and Rihab El Houda Thabet 7. Methodology and Physicochemical Characterization Techniques Used for Failure Analysis in Laboratories Morgane Presle, Daniel Trias and Sébastien Boileau 8. Reliability Study of High-Power Mechatronic Components by Spectral Photoemission Microscopy Niemat Moultif, Alexis Divay, Eric Joubert and Olivier Latry.