Ultra Low Noise CMOS Image Sensors

Springer (Verlag)
  • erschienen am 4. September 2018
  • Buch
  • |
  • Softcover
  • |
  • 196 Seiten
978-3-319-88657-2 (ISBN)
This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied.
Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors.
Softcover reprint of the original 1st ed. 2018
  • Englisch
  • Cham
  • |
  • Schweiz
Springer International Publishing
  • Für Beruf und Forschung
  • 69 farbige Abbildungen, 41 s/w Abbildungen
  • |
  • 69 Illustrations, color; 41 Illustrations, black and white; XIV, 180 p. 110 illus., 69 illus. in color.
  • Höhe: 235 mm
  • |
  • Breite: 155 mm
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  • Dicke: 10 mm
  • 306 gr
978-3-319-88657-2 (9783319886572)
weitere Ausgaben werden ermittelt

Introduction.- Low-Noise CMOS Image Sensors.- Noise Sources and Mechanisms in CIS.- Detailed Noise Analysis in Low-Noise CMOS Image Sensors.- Noise Reduction in CIS Readout Chains.- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process.- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process.- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling.- Downscaling Effects Towards Photon Counting Capability in CIS.- An Ultra Low Noise CMOS THz Imager.- Conclusion.

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